Alpha particle spectroscopy using FNTD and SIM super-resolution microscopy

JJM Kouwenberg, Gert-Jan Kremers, Johan Slotman, HT Wolterbeek, Adriaan Houtsmuller, A G Denkova, AJJ Bos

Research output: Contribution to journal › Article › Academic › peer-review

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Original language	Undefined/Unknown
Pages (from-to)	326-334
Number of pages	9
Journal	Journal of Microscopy-Oxford
Volume	270
Issue number	3
DOIs	https://doi.org/10.1111/jmi.12686
Publication status	Published - 2018

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title = "Alpha particle spectroscopy using FNTD and SIM super-resolution microscopy",

author = "JJM Kouwenberg and Gert-Jan Kremers and Johan Slotman and HT Wolterbeek and Adriaan Houtsmuller and Denkova, {A G} and AJJ Bos",

year = "2018",

doi = "10.1111/jmi.12686",

language = "Undefined/Unknown",

volume = "270",

pages = "326--334",

journal = "Journal of Microscopy",

issn = "0022-2720",

publisher = "Wiley-Blackwell Publishing Ltd",

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}

TY - JOUR

T1 - Alpha particle spectroscopy using FNTD and SIM super-resolution microscopy

AU - Kouwenberg, JJM

AU - Kremers, Gert-Jan

AU - Slotman, Johan

AU - Wolterbeek, HT

AU - Houtsmuller, Adriaan

AU - Denkova, A G

AU - Bos, AJJ

PY - 2018

Y1 - 2018

U2 - 10.1111/jmi.12686

DO - 10.1111/jmi.12686

M3 - Article

SN - 0022-2720

VL - 270

SP - 326

EP - 334

JO - Journal of Microscopy

JF - Journal of Microscopy

IS - 3

ER -