@article{69c72a6c2ce4445ab45415c4fb9d9a80,
title = "Assessment of vulnerable plaque composition by matching the deformation of a parametric plaque model to measured plaque deformation",
author = "Baldewsing, \{RA (Radj)\} and Johannes Schaar and Frits Mastik and CWJ Oomens and \{van der Steen\}, Ton",
year = "2005",
doi = "10.1109/TMI.2005.844170",
language = "Undefined/Unknown",
volume = "24",
pages = "514--528",
journal = "IEEE Transactions on Medical Imaging",
issn = "0278-0062",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
number = "4",
}