TY - GEN
T1 - Automated adjustment of aberration correction in scanning confocal microscopy
AU - Yoo, Han Woong
AU - Verhaegen, Michel
AU - Van Royen, Martin E.
AU - Schitter, Georg
PY - 2012/7/2
Y1 - 2012/7/2
N2 - This contribution demonstrates an automated adjustment of the coverslip correction collar in scanning confocal microscopy to compensate for aberrations caused by coverslip thickness mismatch. An axial image model is derived for filtering the measured axial image to improve the signal to noise ratio. To find the best collar alignment, 70 axial scans equally spaced over the actuation range are recorded and evaluated automatically. The axial scans reveal that different coverslips have a shift of the maximum intensity for optimal imaging along the collar angle. Correction quality such as the maximum intensity or sharpness of the image are examined and used to find the optimal adjustment. The proposed automated correction is demonstrated with two different coverslips and two biological specimen showing the improved resolution of the obtained confocal microscopy images.
AB - This contribution demonstrates an automated adjustment of the coverslip correction collar in scanning confocal microscopy to compensate for aberrations caused by coverslip thickness mismatch. An axial image model is derived for filtering the measured axial image to improve the signal to noise ratio. To find the best collar alignment, 70 axial scans equally spaced over the actuation range are recorded and evaluated automatically. The axial scans reveal that different coverslips have a shift of the maximum intensity for optimal imaging along the collar angle. Correction quality such as the maximum intensity or sharpness of the image are examined and used to find the optimal adjustment. The proposed automated correction is demonstrated with two different coverslips and two biological specimen showing the improved resolution of the obtained confocal microscopy images.
UR - https://www.scopus.com/pages/publications/84864232447
U2 - 10.1109/I2MTC.2012.6229195
DO - 10.1109/I2MTC.2012.6229195
M3 - Conference proceeding
AN - SCOPUS:84864232447
SN - 9781457717710
T3 - 2012 IEEE I2MTC - International Instrumentation and Measurement Technology Conference, Proceedings
SP - 1083
EP - 1088
BT - 2012 IEEE I2MTC - International Instrumentation and Measurement Technology Conference Proceedings
T2 - 2012 IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2012
Y2 - 13 May 2012 through 16 May 2012
ER -