Original language | Undefined/Unknown |
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Title of host publication | DNA damage recognition |
Editors | W. Siede, Y.W. Kow, P.W. Doetsch |
Place of Publication | New York |
Pages | 581-607 |
Number of pages | 27 |
Publication status | Published - 2005 |
Research programs
- EMC MGC-01-12-03
- EMC MM-03-32-04