Dissimilarity-based multiple instance learning

Lauge Sørensen*, Marco Loog, David M.J. Tax, Wan Jui Lee, Marleen De Bruijne, Robert P.W. Duin

*Corresponding author for this work

Research output: Chapter/Conference proceedingConference proceedingAcademicpeer-review

11 Citations (Scopus)

Abstract

In this paper, we propose to solve multiple instance learning problems using a dissimilarity representation of the objects. Once the dissimilarity space has been constructed, the problem is turned into a standard supervised learning problem that can be solved with a general purpose supervised classifier. This approach is less restrictive than kernel-based approaches and therefore allows for the usage of a wider range of proximity measures. Two conceptually different types of dissimilarity measures are considered: one based on point set distance measures and one based on the earth movers distance between distributions of within- and between set point distances, thereby taking relations within and between sets into account. Experiments on five publicly available data sets show competitive performance in terms of classification accuracy compared to previously published results.

Original languageEnglish
Title of host publicationStructural, Syntactic, and Statistical Pattern Recognition - Joint IAPR International Workshop, SSPR and SPR 2010, Proceedings
Pages129-138
Number of pages10
DOIs
Publication statusPublished - 2010
Event7th Joint IAPR International Workshop on Structural, Syntactic, and Statistical Pattern Recognition, SSPR and SPR 2010 - Cesme, Izmir, Turkey
Duration: 18 Aug 201020 Aug 2010

Publication series

SeriesLecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics)
Volume6218 LNCS
ISSN0302-9743

Conference

Conference7th Joint IAPR International Workshop on Structural, Syntactic, and Statistical Pattern Recognition, SSPR and SPR 2010
Country/TerritoryTurkey
CityCesme, Izmir
Period18/08/1020/08/10

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