Integration of prior knowledge of measurement noise in kernel density classification

Samples can be measured with different precisions and reliabilities in different experiments, or even within the same experiment. These varying levels of measurement noise may deteriorate the performance of a pattern recognition system, if not treated with care. Here we seek to investigate the benefit of incorporating prior knowledge about measurement noise into system construction. We propose a kernel density classifier which integrates such prior knowledge. Instead of using an identical kernel for each sample, we transform the prior knowledge into a distinct kernel for each sample. The integration procedure is straightforward and easy to interpret. In addition, we show how to estimate the diverse measurement noise levels in a real world dataset. Compared to the basic methods, the new kernel density classifier can give a significantly better classification performance. As expected, this improvement is more obvious for small sample size datasets and large number of features.