Measuring electron density, electric field and temperature of a micro-discharge air plasma jet using optical emission spectroscopy

Hamed Abbasi, Majid Nazeri, Shahriar Mirpour, Neda Jalali Farahani

Research output: Chapter/Conference proceedingConference proceedingAcademicpeer-review

2 Citations (Scopus)

Abstract

A micro-discharge air plasma jet was developed operated at low frequency (50 Hz) ac high voltage (kV). The micro-discharge plasma jet was generated by feeding air through a dielectric installed between two disk-shaped electrodes with a hole of 1 mm diameter in the center. Both of the electrodes were made of copper. The micro-discharge in the dielectric is evolved as a plasma jet from the outer electrode through its hole. The ac power supply was a neon light transformer. Optical emission spectroscopy was employed to study the plasma discharge characteristics. Specair software was used to analyze the collected spectrum. The reduced electric field and electron density of plasma as well as rotational and vibrational temperatures, referring to ion or gas and electron temperature respectively were measured by processing emission spectrum.

Original languageEnglish
Title of host publicationConference Proceedings of 2015 2nd International Conference on Knowledge-Based Engineering and Innovation, KBEI 2015
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages1139-1141
Number of pages3
ISBN (Electronic)9781467365062
DOIs
Publication statusPublished - 17 Mar 2016
Externally publishedYes
Event2nd International Conference on Knowledge-Based Engineering and Innovation, KBEI 2015 - Tehran, Iran, Islamic Republic of
Duration: 5 Nov 20156 Nov 2015

Publication series

SeriesConference Proceedings of 2015 2nd International Conference on Knowledge-Based Engineering and Innovation, KBEI 2015

Conference

Conference2nd International Conference on Knowledge-Based Engineering and Innovation, KBEI 2015
Country/TerritoryIran, Islamic Republic of
CityTehran
Period5/11/156/11/15

Bibliographical note

Publisher Copyright:
© 2015 IEEE.

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