Optical and morphological characterization of nanostructured AgO thin films

Adeleh Granmayeh Rad; Hamed Abbasi

doi:10.30495/jtap.172304

Optical and morphological characterization of nanostructured AgO thin films

Adeleh Granmayeh Rad^*, Hamed Abbasi

^*Corresponding author for this work

Otorhinolaryngology and Head and Neck Surgery

Research output: Contribution to journal › Article › Academic › peer-review

1 Citation (Scopus)

Abstract

Silver oxide (AgO) thin films were prepared by using a cylindrical direct current reactive magnetron sputtering system at 10⁻⁵ torr initial pressure on BK7 glass substrate. Samples deposited for 3, 5 and 7 minutes. Surface characterization of AgO thin films in the nanometer scale can be accurately determined using the atomic force microscopy (AFM) and X-ray diffraction (XRD). The average roughness (R_avg), maximum peak to valley height (R_t) and root mean square (R_rms) roughness are used to analyze the surface morphology of AgO films. The linear optical absorption data were measured in the visible-near infrared spectral regions and the nonlinear refractive index (n₂) of thin films is evaluated by the moiré deflectometery technique. The investigation indicates that, increase in AgO thickness leads to reduction in nonlinear refractive index.

Original language	English
Article number	172304
Journal	Journal of Theoretical and Applied Physics
Volume	17
Issue number	1
DOIs	https://doi.org/10.30495/jtap.172304
Publication status	Published - Mar 2023

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© 2023, Islamic Azad University. All rights reserved.

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title = "Optical and morphological characterization of nanostructured AgO thin films",

abstract = "Silver oxide (AgO) thin films were prepared by using a cylindrical direct current reactive magnetron sputtering system at 10−5 torr initial pressure on BK7 glass substrate. Samples deposited for 3, 5 and 7 minutes. Surface characterization of AgO thin films in the nanometer scale can be accurately determined using the atomic force microscopy (AFM) and X-ray diffraction (XRD). The average roughness (Ravg), maximum peak to valley height (Rt) and root mean square (Rrms) roughness are used to analyze the surface morphology of AgO films. The linear optical absorption data were measured in the visible-near infrared spectral regions and the nonlinear refractive index (n2) of thin films is evaluated by the moir{\'e} deflectometery technique. The investigation indicates that, increase in AgO thickness leads to reduction in nonlinear refractive index.",

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AB - Silver oxide (AgO) thin films were prepared by using a cylindrical direct current reactive magnetron sputtering system at 10−5 torr initial pressure on BK7 glass substrate. Samples deposited for 3, 5 and 7 minutes. Surface characterization of AgO thin films in the nanometer scale can be accurately determined using the atomic force microscopy (AFM) and X-ray diffraction (XRD). The average roughness (Ravg), maximum peak to valley height (Rt) and root mean square (Rrms) roughness are used to analyze the surface morphology of AgO films. The linear optical absorption data were measured in the visible-near infrared spectral regions and the nonlinear refractive index (n2) of thin films is evaluated by the moiré deflectometery technique. The investigation indicates that, increase in AgO thickness leads to reduction in nonlinear refractive index.

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Optical and morphological characterization of nanostructured AgO thin films

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