Precision of three-dimensional atomic scale measurements from HRTEM images: what are the limits?

W-C Wang, S van Aert, PP Goos, D Dyck

Research output: Contribution to journalArticleAcademicpeer-review

9 Citations (Scopus)
Original languageEnglish
Pages (from-to)20-30
Number of pages11
JournalUltramicroscopy
Volume114
DOIs
Publication statusPublished - 2012

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