Precision of three-dimensional atomic scale measurements from HRTEM images: what are the limits?

W-C Wang
, S van Aert
, PP Goos
, D Dyck

Econometrics

Research output: Contribution to journal › Article › Academic › peer-review

11 Citations (Scopus)

Original language	English
Pages (from-to)	20-30
Number of pages	11
Journal	Ultramicroscopy
Volume	114
DOIs	https://doi.org/10.1016/j.ultramic.2011.12.002
Publication status	Published - 2012

Access to Document

10.1016/j.ultramic.2011.12.002

http://hdl.handle.net/1765/37881

Cite this

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title = "Precision of three-dimensional atomic scale measurements from HRTEM images: what are the limits?",

author = "W-C Wang and \{van Aert\}, S and PP Goos and D Dyck",

year = "2012",

doi = "10.1016/j.ultramic.2011.12.002",

language = "English",

volume = "114",

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journal = "Ultramicroscopy",

issn = "0304-3991",

publisher = "Elsevier",

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T1 - Precision of three-dimensional atomic scale measurements from HRTEM images: what are the limits?

AU - Wang, W-C

AU - van Aert, S

AU - Goos, PP

AU - Dyck, D

PY - 2012

Y1 - 2012

U2 - 10.1016/j.ultramic.2011.12.002

DO - 10.1016/j.ultramic.2011.12.002

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VL - 114

SP - 20

EP - 30

JO - Ultramicroscopy

JF - Ultramicroscopy

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