Reliability yields information gain

IG Sprinkhuizen-Kuyper, EN Smirnov, GI Nalbantov

Research output: Chapter/Conference proceedingConference proceedingAcademicpeer-review

Original languageUndefined/Unknown
Title of host publicationBENELEARN 2005: proceedings of the 14th annual machine learning conference of Belgium and the Netherlands
Pages89-96
Number of pages7
Publication statusPublished - 2005

Research programs

  • EUR ESE 17

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