Review-Level Aspect-Based Sentiment Analysis Using an Ontology

S de Kok, Linda Punt, R van den Puttelaar, K Ranta, Kim Schouten, Flavius Frasincar

Research output: Chapter/Conference proceeding › Conference proceeding › Academic › peer-review

12 Citations (Scopus)

Original language	English
Title of host publication	33rd Symposium on Applied Computing (SAC 2018)
Publisher	ACM
Pages	315-322
Number of pages	8
DOIs	https://doi.org/10.1145/3167132.3167163
Publication status	Published - 2018

Access to Document

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title = "Review-Level Aspect-Based Sentiment Analysis Using an Ontology",

author = "{de Kok}, S and Linda Punt and {van den Puttelaar}, R and K Ranta and Kim Schouten and Flavius Frasincar",

year = "2018",

doi = "10.1145/3167132.3167163",

language = "English",

pages = "315--322",

booktitle = "33rd Symposium on Applied Computing (SAC 2018)",

publisher = "ACM",

address = "United States",

}

TY - GEN

T1 - Review-Level Aspect-Based Sentiment Analysis Using an Ontology

AU - de Kok, S

AU - Punt, Linda

AU - van den Puttelaar, R

AU - Ranta, K

AU - Schouten, Kim

AU - Frasincar, Flavius

PY - 2018

Y1 - 2018

U2 - 10.1145/3167132.3167163

DO - 10.1145/3167132.3167163

M3 - Conference proceeding

SP - 315

EP - 322

BT - 33rd Symposium on Applied Computing (SAC 2018)

PB - ACM

ER -