Shear stress and the IVUS derived vessel wall thickness

Jolanda Wentzel, C (Cheng) Cheng, Rini Crom, N Stergiopulos, PWJC (Patrick) Serruys, CJ Slager, R (Rob) Krams

Research output: Chapter/Conference proceeding › Chapter › Academic

Cite this

@inbook{a129f06a0ade49d8b643e85f35b2330e,

title = "Shear stress and the IVUS derived vessel wall thickness",

author = "Jolanda Wentzel and Cheng, {C (Cheng)} and Rini Crom and N Stergiopulos and Serruys, {PWJC (Patrick)} and CJ Slager and Krams, {R (Rob)}",

year = "2003",

language = "Undefined/Unknown",

isbn = "4431703284",

pages = "148--166",

editor = "Y. Saijo and A.F.W. Steen",

booktitle = "Vascular Ultrasound",

publisher = "Springer-Verlag",

address = "Germany",

}

TY - CHAP

T1 - Shear stress and the IVUS derived vessel wall thickness

AU - Wentzel, Jolanda

AU - Cheng, C (Cheng)

AU - Crom, Rini

AU - Stergiopulos, N

AU - Serruys, PWJC (Patrick)

AU - Slager, CJ

AU - Krams, R (Rob)

PY - 2003

Y1 - 2003

M3 - Chapter

SN - 4431703284

SP - 148

EP - 166

BT - Vascular Ultrasound

A2 - Saijo, Y.

A2 - Steen, A.F.W.

PB - Springer-Verlag

CY - Tokyo

ER -