Shear stress and the IVUS derived vessel wall thickness

Jolanda Wentzel, C (Cheng) Cheng, Rini Crom, N Stergiopulos, PWJC (Patrick) Serruys, CJ Slager, R (Rob) Krams

Research output: Chapter/Conference proceedingChapterAcademic

Original languageUndefined/Unknown
Title of host publicationVascular Ultrasound
EditorsY. Saijo, A.F.W. Steen
Place of PublicationTokyo
Number of pages19
ISBN (Print)4431703284
Publication statusPublished - 2003

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